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rectangular microchannel plate mcp: f2813-22p  (Hamamatsu)

 
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    Hamamatsu rectangular microchannel plate mcp: f2813-22p
    Rectangular Microchannel Plate Mcp: F2813 22p, supplied by Hamamatsu, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/rectangular+microchannel/photomultiplier+tube+hamamatsu+r928/10__1016_slash_j__nimb__2024__165548-94-9-14
    Average 90 stars, based on 1 article reviews
    rectangular microchannel plate mcp: f2813-22p - by Bioz Stars, 2026-10
    90/100 stars

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    Related Articles

    Battery:

    Article Title: Forward and backward emission of secondary ions from biomolecules on single-layer graphene by MeV C+ (n = 1–6) impacts
    Article Snippet: We studied the emission of secondary ions using a cluster ion with MeV energy in transmission secondary ion mass spectrometry.. The primary ions used were 0.6 MeV/atom Cn, where n ranges from 1 to 6.. Single-layer graphene was used as a support membrane for depositing a biomolecular target of phenylalanine.

    Article Title: Probing lithium mobility at a solid electrolyte surface
    Article Snippet: The beam was dispersed using a diffraction grating with 1,200 grooves mm –1 before collection on a microchannel plate detector (Rectangular, Hamamatsu Photonics) coated with CsI.

    Article Title: Sensitive Mass Spectrometer for Time-Resolved Gas-Phase Chemistry Studies at High Pressures.
    Article Snippet: The ions proceed through a 22.6 in. long field-free region, reflect at a 6° angle from a two-stage ion mirror, and are focused onto an 80 × 30 mm2 rectangular microchannel plate (MCP) detector (Hamamatsu.)



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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    Image Search Results


    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, microchannel plate.

    Journal: Nature Materials

    Article Title: Probing lithium mobility at a solid electrolyte surface

    doi: 10.1038/s41563-023-01535-y

    Figure Lengend Snippet: a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, microchannel plate.

    Article Snippet: The beam was dispersed using a diffraction grating with 1,200 grooves mm –1 before collection on a microchannel plate detector (Rectangular, Hamamatsu Photonics) coated with CsI.

    Techniques: Battery